- Nitrogen surface passivation of the Dirac semimetal $mathrm{C}{mathrm{d}}_{3}mathrm{A}{mathrm{s}}_{2}$
- Nontrivial scaling exponents of dislocation avalanches in microplasticity
- Quasi-free-standing single-layer ${mathrm{WS}}_{2}$ achieved by intercalation
- Structural characterization of tantalum nitride films as wet etch stop layer in advanced multiwork function metal gate MOSFETs
- Structural characterization of tantalum nitride films as wet etch stop layer in advanced multiwork function metal gate MOSFETs
- Mechanism of twin-reduced III-V epitaxy on As-modified vicinal Si(111)
- Designing an anisotropic noise filter for measuring critical dimension and line edge roughness from scanning electron microscope images
- Designing an anisotropic noise filter for measuring critical dimension and line edge roughness from scanning electron microscope images
- Silver-doped tin oxide for electrical property enhancement in p-type channel thin film transistor
- Silver-doped tin oxide for electrical property enhancement in p-type channel thin film transistor
- Effects of oxygen-inserted layers and oxide capping layer on dopant activation for the formation of ultrashallow p-n junctions in silicon
- Effects of oxygen-inserted layers and oxide capping layer on dopant activation for the formation of ultrashallow p-n junctions in silicon
- Mobility of two-dimensional materials from first principles in an accurate and automated framework
- Phenol-functionalized polymerization control additives for negative tone epoxide crosslinking molecular resists
- Phenol-functionalized polymerization control additives for negative tone epoxide crosslinking molecular resists
